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Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface

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dc.contributor.author Morán Meza J.A. es_PE
dc.contributor.author Lubin C. es_PE
dc.contributor.author Thoyer F. es_PE
dc.contributor.author Villegas Rosales K.A. es_PE
dc.contributor.author Gutarra Espinoza A.A. es_PE
dc.contributor.author Martin F. es_PE
dc.contributor.author Cousty J. es_PE
dc.date.accessioned 2024-05-30T23:13:38Z
dc.date.available 2024-05-30T23:13:38Z
dc.date.issued 2015
dc.description.abstract The fabrication of ultra-sharp tips from carbon fiber (CF), which are mounted on a qPlus probe for combined dynamic scanning tunneling microscopy (STM) and frequency modulation atomic force microscopy (FM-AFM) experiments, is reported. The carbon fiber tips were electrochemically etched in a KOH or NaOH solution, using different electronic devices. CF tips with an apex radius ∼10 nm, as deduced from the measured slopes of the Fowler–Nordheim plots (kR < 70 nm for k ∼ 6), were routinely obtained with a homemade electronic device that controls the intensity of the etching current. Then, these conductive CF tips were also characterized by imaging the 6H-SiC(0 0 0 1) surface covered by an epitaxial graphene layer in ultra-high vacuum (UHV). The lattice of the R30° reconstruction was regularly imaged by STM working either in non-oscillating mode or in dynamic mode, which also maps the variations of the force gradient. From these measurements with a constant mean-tunneling-current of 20 pA, it was found that the STM tip suffered variations of the tip/surface force gradient in between 8.25 and 16.50 N/m when it scanned the epitaxial graphene layer on the reconstructed 6H-SiC(0 0 0 1) surface.
dc.description.sponsorship Consejo Nacional de Ciencia, Tecnología e Innovación Tecnológica - Concytec
dc.identifier.doi https://doi.org/10.1016/j.carbon.2015.01.050
dc.identifier.scopus 2-s2.0-84924565690
dc.identifier.uri https://hdl.handle.net/20.500.12390/657
dc.language.iso eng
dc.publisher Elsevier Ltd
dc.relation.ispartof Carbon
dc.rights info:eu-repo/semantics/openAccess
dc.subject Thermoelectric equipment
dc.subject Atomic force microscopy es_PE
dc.subject Carbon es_PE
dc.subject Carbon fibers es_PE
dc.subject Frequency modulation es_PE
dc.subject Graphene es_PE
dc.subject Silicon carbide es_PE
dc.subject Dynamic scanning es_PE
dc.subject Electronic device es_PE
dc.subject Epitaxial graphene es_PE
dc.subject Force gradients es_PE
dc.subject Fowler-Nordheim plots es_PE
dc.subject.ocde https://purl.org/pe-repo/ocde/ford#2.10.00
dc.title Fabrication of ultra-sharp tips from carbon fiber for scanning tunneling microscopy investigations of epitaxial graphene on 6H-SiC(0 0 0 1) surface
dc.type info:eu-repo/semantics/article
dspace.entity.type Publication
oairecerif.author.affiliation #PLACEHOLDER_PARENT_METADATA_VALUE#
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